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/**
 * @file    test_io.c
 * @author  foxBMS Team
 * @date    2020-06-10 (date of creation)
 * @updated 2025-03-31 (date of last update)
 * @version v1.9.0
 * @ingroup UNIT_TEST_IMPLEMENTATION
 * @prefix  TEST
 *
 * @brief   Tests for the io module
 * @details Test functions:
 *          - testIO_SetPinDirectionToOutput
 *          - testIO_SetPinDirectionToInput
 *          - testIO_PinSet
 *          - testIO_PinReset
 *          - testIO_PinGet
 *
 */

/*========== Includes =======================================================*/
#include "unity.h"
#include "Mockmcu.h"

#include "io.h"
#include "test_assert_helper.h"

/*========== Unit Testing Framework Directives ==============================*/
TEST_SOURCE_FILE("io.c")

TEST_INCLUDE_PATH("../../src/app/driver/io")

/*========== Definitions and Implementations for Unit Test ==================*/

/*========== Setup and Teardown =============================================*/
void setUp(void) {
}

void tearDown(void) {
}

/*========== Test Cases =====================================================*/

void testIO_SetPinDirectionToOutput(void) {
    volatile uint32_t registerValue = 1u;
    TEST_ASSERT_FAIL_ASSERT(IO_SetPinDirectionToOutput(NULL_PTR, 0u));
    TEST_ASSERT_FAIL_ASSERT(IO_SetPinDirectionToOutput(&registerValue, MCU_LARGEST_PIN_NUMBER + 1u));

    /* 0 -> 1 */
    IO_SetPinDirectionToOutput(&registerValue, 0u);
    TEST_ASSERT_EQUAL(1u, registerValue);

    /* 1 -> 1 */
    IO_SetPinDirectionToOutput(&registerValue, 0u);
    TEST_ASSERT_EQUAL(1u, registerValue);
}

void testIO_SetPinDirectionToInput(void) {
    volatile uint32_t registerValue = 1u;
    TEST_ASSERT_FAIL_ASSERT(IO_SetPinDirectionToInput(NULL_PTR, 0u));
    TEST_ASSERT_FAIL_ASSERT(IO_SetPinDirectionToInput(&registerValue, MCU_LARGEST_PIN_NUMBER + 1u));

    /* 1 -> 0 */
    IO_SetPinDirectionToInput(&registerValue, 0u);
    TEST_ASSERT_EQUAL(0u, registerValue);

    /* 0 -> 0 */
    IO_SetPinDirectionToInput(&registerValue, 0u);
    TEST_ASSERT_EQUAL(0u, registerValue);
}

void testIO_PinSet(void) {
    volatile uint32_t registerValue = 0u;
    TEST_ASSERT_FAIL_ASSERT(IO_PinSet(NULL_PTR, 0u));
    TEST_ASSERT_FAIL_ASSERT(IO_PinSet(&registerValue, MCU_LARGEST_PIN_NUMBER + 1u));

    /* 0 -> 1 */
    IO_PinSet(&registerValue, 0u);
    TEST_ASSERT_EQUAL(1u, registerValue);

    /* 1 -> 1 */
    IO_PinSet(&registerValue, 0u);
    TEST_ASSERT_EQUAL(1u, registerValue);
}

void testIO_PinReset(void) {
    volatile uint32_t registerValue = 1u;
    TEST_ASSERT_FAIL_ASSERT(IO_PinReset(NULL_PTR, 0u));
    TEST_ASSERT_FAIL_ASSERT(IO_PinReset(&registerValue, MCU_LARGEST_PIN_NUMBER + 1u));

    /* 1 -> 0 */
    IO_PinReset(&registerValue, 0u);
    TEST_ASSERT_EQUAL(0u, registerValue);

    /* 0 -> 0 */
    IO_PinReset(&registerValue, 0u);
    TEST_ASSERT_EQUAL(0u, registerValue);
}

void testIO_PinGet(void) {
    volatile uint32_t registerValue = 1u;
    /* invalid argument tests */
    TEST_ASSERT_FAIL_ASSERT(IO_PinGet(NULL_PTR, 0u));
    TEST_ASSERT_FAIL_ASSERT(IO_PinGet(&registerValue, MCU_LARGEST_PIN_NUMBER + 1u));

    TEST_ASSERT_EQUAL(STD_PIN_LOW, IO_PinGet(&registerValue, 1u));
    TEST_ASSERT_EQUAL(STD_PIN_HIGH, IO_PinGet(&registerValue, 0u));
}
